ELES Semiconductor
ELES provides High Performance Reliability Test Solutions
for the Zero Defects Approach
Art 200
Key Features:
- 288 I/O channels -20MHz Test Rate
- APG –Flexible algorithmic pattern generator
- 512MB on board pattern memory (64MV)
- On-fly pattern fast reloading
- Real time Monitoring and logging capability
- Different Options for Device Power Supply to cover a wide application range: 0.5V to 100V
- Voltage & Current measurement capability
- Medium / High Power kits for High Current -Low Voltages power supplies
- Single Device Temperature Management (LTC)
- Up to 12 Independent test slots to process different product or test in the same oven
ART200 Test Driver Characteristics
BASIC Power Supply capabilities:
6 basic power supply channels slots, configurable with:
- -20 .. +20 V 12.5 A 60 W
- -100 .. +100 V 6 A 60 W
- 15 mV resolution
- Real time monitor on voltage and current (Alarm management and log)
- 6 reference voltage channels with current measurement capability
- -12.6 .. +12.6 V 180 mA
- 10mV resolution
- Power On/Off sequences
- Controllable ramps and delay
- Sensing on BIB
- Power supply parameters can be set or modified on fly by Test Program
Analog Expansion (optional):
- 4 output channels
- Sine, Square, Differential
- 1Hz … 10MHz frequency
- 0.2V … 20V amplitude
Test Board connectors
- 540 edge contacts (3A each)
PIN Electronics:
- 288 I/O channels
+ 8 clock drivers up to 40MHz
+ Tri-state capability
+ Prog. Comparator Vth - 0-VihV, Vih=0.8…12V, on-fly configurable
- Third level Vihon 144 signals
- 200 mA (2A peak) output current on 16 channels, 100 mA (1A peak) on the remaining ones
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